Modeling Titanium Oxide Growth by Chemical Vapor Deposition Using Titanium Tetra Isopropoxide
Autor: | Katsuya Shitanaka, Hiroshi Murakami, Yasunobu Akiyama |
---|---|
Rok vydání: | 2008 |
Předmět: | |
Zdroj: | JOURNAL OF CHEMICAL ENGINEERING OF JAPAN. 41:779-784 |
ISSN: | 1881-1299 0021-9592 |
DOI: | 10.1252/jcej.07we118 |
Popis: | Titanium oxide (TiO2) thin films were grown on Si(100) substrates using the chemical vapor deposition (CVD) of titanium tetra isopropoxide (TTIP; Ti(OCH(CH3)2)4). The distribution of the growth rate in the reactor and the step coverage of films grown in the range 593–1173 K could was using our “simple reaction model.” The TTIP changed into TiO2 directly via a surface reaction. The surface reaction rate constant was determined by comparing the step coverage of grown and simulated films. The activation energy of the surface reaction was 212 kJ/mol (T < 710 K). |
Databáze: | OpenAIRE |
Externí odkaz: |