Modeling Titanium Oxide Growth by Chemical Vapor Deposition Using Titanium Tetra Isopropoxide

Autor: Katsuya Shitanaka, Hiroshi Murakami, Yasunobu Akiyama
Rok vydání: 2008
Předmět:
Zdroj: JOURNAL OF CHEMICAL ENGINEERING OF JAPAN. 41:779-784
ISSN: 1881-1299
0021-9592
DOI: 10.1252/jcej.07we118
Popis: Titanium oxide (TiO2) thin films were grown on Si(100) substrates using the chemical vapor deposition (CVD) of titanium tetra isopropoxide (TTIP; Ti(OCH(CH3)2)4). The distribution of the growth rate in the reactor and the step coverage of films grown in the range 593–1173 K could was using our “simple reaction model.” The TTIP changed into TiO2 directly via a surface reaction. The surface reaction rate constant was determined by comparing the step coverage of grown and simulated films. The activation energy of the surface reaction was 212 kJ/mol (T < 710 K).
Databáze: OpenAIRE