Structural and chemical analysis of pulsed laser deposited MgxZn1−xO hexagonal (x=0.15,0.28) and cubic (x=0.85) thin films
| Autor: | D.E. Pugel, R. D. Vispute, Nilima V. Hullavarad, Sankar Dhar, T. Venkatesan, Shiva S. Hullavarad |
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| Rok vydání: | 2008 |
| Předmět: |
Band gap
Chemistry Organic Chemistry Analytical chemistry Wide-bandgap semiconductor Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Pulsed laser deposition Inorganic Chemistry Crystallinity Full width at half maximum Crystallography X-ray photoelectron spectroscopy Electrical and Electronic Engineering Physical and Theoretical Chemistry Thin film Spectroscopy |
| Zdroj: | Optical Materials. 30:993-1000 |
| ISSN: | 0925-3467 |
| Popis: | Hexagonal and cubic Mg x Zn 1− x O thin films corresponding to optical band gaps of 3.52 eV, 4 eV and 6.42 eV for x = 0.15, 0.28 and 0.85 compositions were grown by pulsed laser deposition technique. The crystalline quality of the films was investigated by X-ray diffraction–rocking curve measurements and indicated a high degree of crystallinity with narrow FWHM’s of 0.21°–0.59°. Rutherford back scattering–channeling spectroscopy provides channeling yields of 7–14% indicating the good crystalline quality of the thin films. X-Ray photoelectron spectroscopy measurements clearly indicated different level of oxidation states of Mg and Zn. |
| Databáze: | OpenAIRE |
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