Track Effects and their Influence on Heavy Ion Energy Losses in Semiconductor Devices

Autor: J. Levinson, Y. Lifshitz, A. Akkerman, D. Ilberg
Rok vydání: 1993
Předmět:
Zdroj: NATO ASI Series ISBN: 9781461362296
DOI: 10.1007/978-1-4615-2840-1_29
Popis: The Linear Energy Transfer (LET) concept is widely used in the context of Single Event Phenomena (SEP) in electronic devices induced by energetic heavy particles and protons in space missions. Very recently several experimental results have shown that the LET concept may not be adequate for a quantitative evaluation of a variety of SEP. Stapor et al.1 showed that different charge collection values in specially designed electronic devices were obtained for ions having the same LET but different energies. In two recent conferences E. Stassinopoulos2 gave a critical analysis for the validity of the LET concept in SEP while P. Sigmund discussed the relevance of the LET concept for secondary electron emission. There are also some indications of the failure of using LET as a measure in radiobiological investigations.
Databáze: OpenAIRE