Micro-Raman characterization of SiC polytype natural heterostructures

Autor:	Marion Renucci, V. V. Artamonov, Mikhail Ya. Valakh, Alexei V. Pogorelov
Rok vydání:	1995
Předmět:	Diffraction Photoluminescence Materials science Scattering business.industry Characterization (materials science) symbols.namesake Crystallography chemistry.chemical_compound chemistry X-ray crystallography symbols Silicon carbide Optoelectronics Raman spectroscopy business Raman scattering
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
Popis:	MicroRaman, Raman, photoluminescence and x-ray diffraction spectra were measured for different SiC splices. It has been shown that Raman and especially MicroRaman scattering gives us a gain over other diagnostic techniques on the way to define polytype structure of the splice.© (1995) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::04c6c490e65373b4547a198f3412b137 https://doi.org/10.1117/12.225295 Zobrazit plný text záznamu