| Autor: |
Darrell G. Hill, H. Henry, Manoj Nair, Scott Kiefer, S. Mitra, Mariam G. Sadaka, Paul W. Sanders, M. Sutton, Syd R. Wilson, John W. Steele |
| Rok vydání: |
2002 |
| Předmět: |
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| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2002p0173 |
| Popis: |
Visible to infra-red photon emissions can be readily observed in compound semiconductor devices through the semi-insullating substrate and are useful in fault identification when analyzing yield problems. The techniques described here have uncovered several yield-limiting mechanisms and have lead to rapid and effective corrective measures. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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