Pile-up correction in characterizing single-photon avalanche diodes of high dark count rate
| Autor: | Xiao Jiang, Kai Zang, Qiang Zhang, Matthew Morea, Yueyang Fei, Tianzhe Zheng, Ge Jin, James S. Harris, Xun Ding, Tao Su |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Physics Photon Avalanche diode Computer simulation business.industry Pulse (signal processing) Detector 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials 010309 optics Optics Distortion 0103 physical sciences Electrical and Electronic Engineering business Diode Jitter |
| Zdroj: | Optical and Quantum Electronics. 50 |
| ISSN: | 1572-817X 0306-8919 |
| DOI: | 10.1007/s11082-018-1517-x |
| Popis: | Although as a single-photon detector, the single-photon avalanche diode (SPAD) may be applied to multi-photon conditions. At a minimum, SPADs with a high dark count rate (DCR) demand a higher value of photon number per pulse to improve the signal-to-noise ratio. In this case, and without correction, severe pile-up distortion may induce a system error in the measurement of photon detection efficiency (PDE) and timing jitter. In this paper, we study the pile-up distortion in SPAD characterization by numerical simulation and experimentation, and introduce a pile-up correction method for the precise characterization of PDE and timing jitter in immature SPADs with an unintentionally high DCR. The results of this study are useful in the development of future SPADs. |
| Databáze: | OpenAIRE |
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