Fidelity of noisy multiple-control reversible gates
| Autor: | I.M. Yuriychuk, I. Lemberski, V.G. Deibuk |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Materials science
media_common.quotation_subject Fidelity 02 engineering and technology 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Computer Science::Hardware Architecture Computer Science::Emerging Technologies 020204 information systems 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering 010306 general physics Control (linguistics) media_common |
| Zdroj: | Semiconductor Physics, Quantum Electronics and Optoelectronics. 23:385-392 |
| ISSN: | 1605-6582 1560-8034 |
| Popis: | The effect of frequency noise on correct operation of the multiple-control Toffoli, Fredkin, and Peres gates has been discussed. In the framework of the Ising model, the energy spectrum of a chain of atoms with nuclear spins one-half in a spinless semiconductor matrix has been obtained, and allowed transitions corresponding to the operation algorithm of these gates have been determined. The fidelities of the obtained transitions were studied depending on the number of control qubits and parameters of the radio-frequency control pulses. It has been shown that correct operation of the Toffoli and Fredkin gates does not depend on the number of control qubits, while the Peres gate fidelity decreases significantly with the increasing number of control signals. The calculated ratios of the Larmor frequency to the exchange interaction constant correspond with the results of other studies. |
| Databáze: | OpenAIRE |
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