Vernier fringe‐counting device for laser wavelength measurements

Autor:	Boris P. Stoicheff, M. S. O’Sullivan, N. M. Sanford, A. Kahane
Rok vydání:	1983
Předmět:	Physics Systematic error Reproducibility business.industry Vernier scale Michelson interferometer Laser law.invention Wavelength Interferometry Optics law business Instrumentation
Zdroj:	Review of Scientific Instruments. 54:1138-1142
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1137537
Popis:	A vernier fringe‐counting circuit designed for use with a Kowalski‐type wavemeter is described. Wavelength measurements made with this device have a high reproducibility of 5×10−9 (or 1/50 of a fringe) and measured accuracy of 4×10−9. The results of accuracy tests are presented along with systematic errors incurred when the wavelengths of two He–Ne lasers (632.9 nm) are compared by the vernier method.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0419b7cb1e964eda444c7600807d22d5 https://doi.org/10.1063/1.1137537 Zobrazit plný text záznamu