| Autor: |
Joseph I. Goldstein, Joseph R. Michael, Eric Lifshin, Linda Sawyer, Patrick Echlin, Dale E. Newbury, David C. Joy, Charles E. Lyman |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
Scanning Electron Microscopy and X-ray Microanalysis ISBN: 9781461349693 |
| Popis: |
The electron beam generates x-ray photons in the beam–specimen interaction volume beneath the specimen surface. X-ray photons emerging from the specimen have energies specific to the elements in the specimen; these are the characteristic x-rays that provide the SEM’s analytical capabilities (see Fig. 6.1). Other photons have no relationship to specimen elements and constitute the continuum background of the spectrum. The x-rays we analyze in the SEM usually have energies between 0.1and 20 keV. Our task in this chapter is to understand the physical basis for the features in an x-ray spectrum like that shown in Fig. 6.1. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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