SEFI cross-section evaluation by fault injection software approach and hardware detection
| Autor: | I. I. Shvetsov-Shilovskiy, I.O. Loskutov, Dmitry V. Boychenko, V.M. Uzhegov, P. V. Nekrasov |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Test setup business.industry Computer science Labview software 02 engineering and technology Fault injection Modular design 01 natural sciences 020202 computer hardware & architecture Cross section (physics) Microcontroller Software 0103 physical sciences 0202 electrical engineering electronic engineering information engineering business Computer hardware |
| Zdroj: | 2017 IEEE 30th International Conference on Microelectronics (MIEL). |
| DOI: | 10.1109/miel.2017.8190114 |
| Popis: | This paper presents the system that allows SEFI modelling by means of injecting upsets in different microcontroller memory blocks, carrying out its functional control and detect the moment when SEFI occurs. Test setup was developed on the basis of National Instruments PXI modular equipment and LabVIEW software. Developed fault injection system was tested on PIC17 microcontroller. The comparison between simulation results and ground tests is presented. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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