Spectroscopic Ellipsometry for Characterization of Thin Films of Polymer Blends

Autor: M. Gensch, Jürgen Pionteck, N. A. Nikonenko, Karsten Hinrichs, Klaus-Jochen Eichhorn
Rok vydání: 2005
Předmět:
Zdroj: Macromolecular Symposia. 230:26-32
ISSN: 1521-3900
1022-1360
Popis: Morphology, composition, miscibility, interdiffusion, and interactions at interfaces are important quantities of polymer blends. Many of these parameters can be probed with spectroscopic ellipsometry. Ellipsometry in the visible spectral range is very suitable for determination of thicknesses and the high frequency refractive indices of thin organic films. However the spectral contrast is low for many polymers in comparison to infrared spectroscopic ellipsometry (IRSE) where specific contributions of the molecular vibrations are probed. In the presented study the infrared optical constants of a double layer (206.6 nm in total) of poly(n-butyl methacrylate) (PnBMA) and poly(vinyl chloride) (PVC) and of the films of the single compounds have been determined with optical simulations using layer models. The multiple layer model served for simulation of the ellipsometric spectra taken after an annealing induced mixing process in a polymeric double layer. The ellipsometric spectra of a not completely mixed sample could be fitted in a three-layer model, in which a mixed interphase in between the two layers of the polymers is formed due to interdiffusion.
Databáze: OpenAIRE
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