SiC MOSFET Avalanche Breakdown Voltage Model for Temperature and Gate Voltage Dependence

Autor: A. LLamazares, M. Garcia-Gracia, S. Martin-Arroyo, J.A. Cebollero
Rok vydání: 2021
Zdroj: 2021 4th International Symposium on Advanced Electrical and Communication Technologies (ISAECT).
DOI: 10.1109/isaect53699.2021.9668386
Databáze: OpenAIRE