Fabrication of SiC JFET-Based Monolithic Integrated Circuits

Autor: Mehran Mehregany, Amita C. Patil, Xiao-An Fu, Steven L. Garverick, Te Hao Lee
Rok vydání: 2010
Předmět:
Zdroj: Materials Science Forum. :1115-1118
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.645-648.1115
Popis: We report fabrication of lateral, n-channel, depletion-mode, junction-field-effect-transistor (JFET) monolithic analog integrated circuits (ICs) in 6H-SiC. Ti/TaSi2/Pt forms the contact metalization, Ti/Pt the interconnect metal, and the SiO2/Si3N4/SiO2 interlayer dielectric. The threshold voltage and pinch off current indicate that the actual channel doping and thickness is close to the nominal values specified. The wafer yield for good circuits of a single-stage differential amplifier is 54% out of 46 copies.
Databáze: OpenAIRE