| Popis: |
We present a fourth-design generation Free Running Oscillator and Voltage Controlled Oscillator using integrated bipolar circuitry in the lid wafer with a temperature-compensated FBAR resonator in the base wafer. The goal is to produce a high frequency, low-noise oscillator. Because there are ~15,000 oscillators per wafer, we can develop very sensitive testing procedures to study the oscillator behavior. For example, we have determined our frequency measurement accuracy and precision to be ~ 0.2 parts-per-million (1 σ), and our phase sensitivity floor to be less than -180 dBc/Hz. Measurements on package hermeticity, suggest that the oscillators behave with the same level of integrity as our standard FBAR filters. |
