Status of GaN HEMT performance and reliability

Autor: M. J. Poulton, R. Vetury, D. S. Green, J. Martin, Jeffrey B. Shealy, K. Krishnamurthy, J. D. Brown, Sangmin Lee, Shawn R. Gibb
Rok vydání: 2008
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.763781
Popis: This report will focus on the status of GaN HEMT based amplifier technology development at RFMD. This technology is based around GaN on semi-insulating SiC substrates for optimal thermal performance. RFMD's 0.5μm gate technology features high performance advanced field plate structures, including a unit power cell producing high gain (21dB), high power density (3-5W/mm at 28V) and high efficiency (65-70 percent) at cellular frequencies. We will report on transistor and module performance relevant to applications ranging from high power, high bandwidth amplifiers, to switches and ICs for radar, electronic warfare, cellular infrastructure and homeland security. Additionally, we will report on reliability results that demonstrate capability for dependable, high voltage operation.
Databáze: OpenAIRE