Temporal response of silicon EUV and soft X-ray detectors

Autor:	A. P. Artyomov, V. L. Suhanov, Nikolai A. Sobolev, E. H. Baksht, V. V. Zabrodskii, Victor F. Tarasenko, M. V. Petrenko, S. A. Chaikovsky, P. N. Aruev, A. V. Fedunin
Rok vydání:	2015
Předmět:	Physics Silicon business.industry Extreme ultraviolet lithography Detector chemistry.chemical_element Electron Radiation Generator (circuit theory) Optics chemistry Picosecond Temporal resolution Optoelectronics business Instrumentation
Zdroj:	Instruments and Experimental Techniques. 58:102-106
ISSN:	1608-3180 0020-4412
Popis:	A small-sized generator of picosecond electron beams is used to measure the temporal resolution of EUV and soft X-ray silicon detectors produced by the Ioffe Physical Technical Institute, Russian Academy of Sciences. The temporal resolution of the EUV and soft X-ray detectors based on silicon photodiodes is shown to be ∼1 ns. Preliminary experiments have been performed using these detectors with the aim of investigating the radiation characteristics of a soft X-ray source based on an X-pinch driven by a small-sized highcurrent generator with a current pulse amplitude of 250 kA. This source is used at the Institute of High Current Electronics for soft X-ray backlighting diagnostics of various plasmas.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0323293c1fcb193233c8d026ebd7495e https://doi.org/10.1134/s0020441215010017 Zobrazit plný text záznamu Plný text ve formátu PDF