Experimental ray-tracing – a precise and accurate method for the determination of the properties of optical systems

Autor:	A. Wallianos, K. Traxel, Stefan Scheloske, Thorsten Schneider, A. Núñez-Ruiz, M. Maetz, C. Wies
Rok vydání:	1999
Předmět:	Nuclear and High Energy Physics Microscope Chemistry business.industry Image plane Secondary electrons Pencil (optics) law.invention Optics law Secondary emission Magnet Quadrupole business Instrumentation Image resolution
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 158:90-96
ISSN:	0168-583X
Popis:	We developed a new technique to determine the impact position of single pencil beams in the image plane with an accuracy of 0.2 μm. This technique bases on the overlapping of secondary electron images from a 1000 mesh grid. The measurements themselves can be obtained without any change in the routine setup if a secondary electron counter is installed. By choosing different object positions (x0, y0) and divergence angles (θ0, ϕ0) for the pencil beam the characteristics of the used lens system can be analysed and the lens errors can be calculated with high precision. Results for the Heidelberg quadrupole doublet will be reported.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::02fc63d3cd4f517505bbc4b69f4c860d https://doi.org/10.1016/s0168-583x(99)00332-8 Zobrazit plný text záznamu Full Text from ScienceDirect