Evaluation of Reference X-ray Diffraction Patterns in the ICDD Powder Diffraction File

Autor:	K. J. Martin, Gregory J. McCarthy, Jean M. Holzer, W. M. Syvinski, R. G. Garvey
Rok vydání:	1990
Předmět:	Crystallography Materials science X-ray crystallography General Medicine Input format Remainder Reference patterns 010402 general chemistry 010403 inorganic & nuclear chemistry 01 natural sciences Powder diffraction 0104 chemical sciences Diffractometer
Zdroj:	Advances in X-ray Analysis. 34:369-376
ISSN:	2631-3626 0376-0308
Popis:	Procedures and tools for evaluation of reference x-ray powder patterns in the JCPDSICDD Powder Diffraction File are illustrated by a review of air-stable binary oxides. The reference patterns are evaluated using an available microcomputer version of the NBS*A1DS83 editorial program and PDF patterns retrieved directly from the CD-ROM in the program's input format. The patterns are compared to calculated and experimental diffractograms. The majority of the oxide patterns have been found to be in good agreement with the calculated and observed diffractograms, but are often missing some weak reflections routinely observed with a modern diffractometer. These weak reflections are added to the PDF pattern. For the remainder of the phases, patterns are redetermined.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::02da46f3e17849d3ff4305b7c9b2b84b https://doi.org/10.1154/s0376030800014683 Zobrazit plný text záznamu