Autor: |
Xiaolu Ju, Biao Deng |
Rok vydání: |
2021 |
Předmět: |
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Zdroj: |
Advanced X-ray Imaging of Electrochemical Energy Materials and Devices ISBN: 9789811653278 |
DOI: |
10.1007/978-981-16-5328-5_6 |
Popis: |
Synchrotron radiation based X-ray fluorescence imaging is one of the effective tools to analyze the distribution of elements in samples. The principle of X-ray fluorescence and the development of X-ray fluorescence imaging methodology are introduced in the paper. And then some application examples of X-ray fluorescence imaging in various fields will be shared. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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