Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters
| Autor: | Hyunjung Kim, David E. Aspnes, Sukgeun Choi, Chris Palmstrom, N. A. Stoute, Yun-Chorng Chang, Yeriaron Kim |
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| Rok vydání: | 2008 |
| Předmět: |
Condensed matter physics
Chemistry Alloy Analytical chemistry Surfaces and Interfaces Dielectric engineering.material Condensed Matter Physics Spectral line Critical point (mathematics) Surfaces Coatings and Films Electronic Optical and Magnetic Materials Reciprocal lattice Materials Chemistry engineering Spectroscopic ellipsometry Dielectric function Electrical and Electronic Engineering Thin film |
| Zdroj: | physica status solidi (a). 205:884-887 |
| ISSN: | 1862-6319 1862-6300 |
| DOI: | 10.1002/pssa.200777848 |
| Popis: | Spectroscopic ellipsometry is used to determine pseudodi-electric function spectra = |
| Databáze: | OpenAIRE |
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