Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel
| Autor: | Yao Chin Wang, Kei-Hsiung Yang, Bor-Shyh Lin |
|---|---|
| Rok vydání: | 2014 |
| Předmět: |
Engineering
Liquid-crystal display Pixel business.industry Applied Mathematics ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Characterization (materials science) law.invention Transformation (function) Thin-film transistor law Electronic engineering Optoelectronics Imaging technique Electrical and Electronic Engineering business Instrumentation Voltage |
| Zdroj: | Measurement. 51:236-240 |
| ISSN: | 0263-2241 |
| Popis: | Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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