A Radiation-Hardened Readout Integrated Circuits for Sensor Systems
| Autor: | Minseong Um, Ik Joon Chang, Duckhoon Ro, Hyung-Min Lee |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010308 nuclear & particles physics
Computer science Successive approximation ADC Hardware_PERFORMANCEANDRELIABILITY Integrated circuit 01 natural sciences 010305 fluids & plasmas law.invention Effective number of bits Soft error law Absorbed dose 0103 physical sciences Hardware_INTEGRATEDCIRCUITS Electronic engineering ComputerSystemsOrganization_SPECIAL-PURPOSEANDAPPLICATION-BASEDSYSTEMS Instrumentation amplifier Hardware_ARITHMETICANDLOGICSTRUCTURES Electronic circuit Voltage |
| Zdroj: | 2020 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia). |
| Popis: | Radiation-hardened IA and ADC circuits are essential for a safe and efficient sensor system. In this paper, three-op-amp IA and SAR ADC were designed using radiation-hardened techniques and measured and proved to be robust to TID and SEE. Both Radiation-hardened IA and ADC were fabricated in a 65nm CMOS process and measured in an ARTI high-level radiation environment. The proposed IA was able to confirm that the voltage gain was accurate against TID effects in the harsh radiation environment. The proposed ADC obtained 9.59 ENOB at 5.54mW power consumption. |
| Databáze: | OpenAIRE |
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