X-Tip: a New Tool for Nanoscience or How to Combine X-Ray Spectroscopies to Local Probe Analysis
Autor: | Rodrigues Mario, Felici Roberto, Chevrier Joel, Dhez Olivier, Comin Fabio |
---|---|
Rok vydání: | 2007 |
Předmět: | |
Zdroj: | AIP Conference Proceedings. |
ISSN: | 0094-243X |
Popis: | With the advent of nanoscale science, the need of tools able to image samples and bring the region of interest to the X‐ray beam is essential. We show the possibility of using the high resolution imaging capability of a scanning probe microscope to image and align a sample relative to the X‐ray beam, as well as the possibility to record the photoelectrons emitted by the sample. |
Databáze: | OpenAIRE |
Externí odkaz: |