X-Tip: a New Tool for Nanoscience or How to Combine X-Ray Spectroscopies to Local Probe Analysis

Autor:	Rodrigues Mario, Felici Roberto, Chevrier Joel, Dhez Olivier, Comin Fabio
Rok vydání:	2007
Předmět:	Physics Nanostructure business.industry Astrophysics::High Energy Astrophysical Phenomena Resolution (electron density) X-ray optics Nanotechnology Photoelectric effect Sample (graphics) Scanning probe microscopy Optics Microscopy business Beam (structure)
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
Popis:	With the advent of nanoscale science, the need of tools able to image samples and bring the region of interest to the X‐ray beam is essential. We show the possibility of using the high resolution imaging capability of a scanning probe microscope to image and align a sample relative to the X‐ray beam, as well as the possibility to record the photoelectrons emitted by the sample.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::02405f751a883101fed0045f277e13e8 https://doi.org/10.1063/1.2436324 Zobrazit plný text záznamu