Diamond X-ray personal dosimetry. Numerical evaluation against silicon response

Autor:	M. Jung, C. Teissier, Ph. Meyer, J. Morel, P. Siffert
Rok vydání:	2003
Předmět:	Physics Nuclear and High Energy Physics Thin layers Silicon business.industry Diamond chemistry.chemical_element engineering.material Particle detector Semiconductor detector Optics Semiconductor chemistry engineering Dosimetry business Instrumentation Diode
Zdroj:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 511:417-424
ISSN:	0168-9002
DOI:	10.1016/s0168-9002(03)01948-x
Popis:	The performances achieved by diamond planar detectors are presented in comparison with high-sensitive personal silicon semiconductor dosimetric responses. Numerical simulation results are discussed in terms of diode signal pulse height analysis. The study already allows the proposition of thin layers of diamond for personal dosimetry of X-rays ranging between 20 and 660 keV .
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::017ff801ac9efadcb0a529e2aa0b6afe https://doi.org/10.1016/s0168-9002(03)01948-x Zobrazit plný text záznamu Full Text from ScienceDirect