In-situX-ray diffraction measurements for monitoring carbide and silicide phase formation

Autor:	Wouter Leroy, Roland Vanmeirhaeghe, Dirk Poelman, Christian Lavoie, Davy Deduytsche, Christophe Detavernier
Rok vydání:	2006
Předmět:	In situ chemistry.chemical_compound Crystallography Materials science chemistry Structural Biology X-ray crystallography Silicide Selected area diffraction Phase formation Carbide Electron backscatter diffraction
Zdroj:	Acta Crystallographica Section A Foundations of Crystallography. 62:s114-s114
ISSN:	0108-7673
DOI:	10.1107/s0108767306097716
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::017f04d5d2d8bd96ca9de8b0b9bed32e https://doi.org/10.1107/s0108767306097716 Zobrazit plný text záznamu Plný text