Scanning x‐ray microscopy using a laser‐plasma source

Autor:	G. F. Foster, A. G. Michette, M. T. Browne, M. S. Schulz, I. C. E. Turcu, Christopher Buckley, G. R. Morrison, P. Fluck
Rok vydání:	1993
Předmět:	Physics Microscope Scanning electron microscope business.industry Astrophysics::High Energy Astrophysical Phenomena Resolution (electron density) Undulator Laser Synchrotron law.invention Optics Beamline law Microscopy business Instrumentation
Zdroj:	Review of Scientific Instruments. 64:1478-1482
ISSN:	1089-7623 0034-6748
Popis:	Previously high‐resolution soft x‐ray microscopy has only been possible with synchrotron sources. Here, the first successful attempts at using a scanning transmission x‐ray microscope with a laser‐plasma source are reported. Spatial resolutions were limited to about 650 nm by electrical noise in the detector, but single shot per pixel images were obtained of test and real specimens. The microscope was not optimized to the source since it was designed for use on the undulator beam line of a synchrotron. With an improved system, it is demonstrated that single shot per pixel imaging at high resolution (better than 50 nm) will routinely be possible.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0174fd80585515412e8773558d976f5f https://doi.org/10.1063/1.1144067 Zobrazit plný text záznamu