| Autor: |
Shyuan-Jeng Ho, Chung-Wei Lai, Chun-Wei Chen, Cheng-Chang Kuo, Yan-Fu Lin |
| Rok vydání: |
2011 |
| Předmět: |
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| Zdroj: |
2011 37th IEEE Photovoltaic Specialists Conference. |
| DOI: |
10.1109/pvsc.2011.6186376 |
| Popis: |
PECVD SiO x thin film combined with SiN x :H layer was used as dual anti-reflecting coating (DARC) to minimize surface reflectance. The advanced DARC enhanced cell efficiency of mono-crystalline and multi-crystalline Si solar cells by 0.15% and 0.31% with one more additional process. Short circuit current density (J sc ) of mono-crystalline and multi-crystalline was gained as 0.5 mA/cm2 and 0.6 mA/cm2 respectively. Efficiency improvement due to the blue response was confirmed by EQE measurements. Therefore, DARC process shows a good potential for higher cell efficiency for industrial crystalline Si cell production line. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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