Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAM

Autor:	Sanghyeon Baeg, Donghyuk Yun, Myungsun Chun, Shi-Jie Wen
Rok vydání:	2022
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 69:558-566
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2022.3149487
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::01332f5848ddee347145eb2f99e4fa28 https://doi.org/10.1109/tns.2022.3149487 Zobrazit plný text záznamu