Accurate measurement of Aluminum layer thickness in a multilayer material using eddy current sensor
| Autor: | Samir Bensaid, Ala Eddine Lakhdari, Islam Nacereddine El Ghoul, Ahmed Cheriet |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Eddy-current sensor Acoustics System of measurement chemistry.chemical_element 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Layer thickness law.invention chemistry Aluminium law 0103 physical sciences Eddy current Electronic engineering Sensitivity (control systems) 0210 nano-technology Layer (electronics) |
| Zdroj: | 2016 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM). |
| Popis: | This paper presents an eddy current sensor based system that allows thickness measurement of an Aluminum layer in multilayer material. An electromagnetic analytical model is used to give the relationship between the response of the eddy current sensor and the Aluminum layer thickness for different frequencies, and then looking for the optimal working frequency according to a given criterion. The measurement system is performed and controlled by a Labview application in which the analytical relationship is integrated. Some experimental samples of multilayer material containing an Aluminum layer with different thicknesses are used to verify the measurement system. A good accuracy and agreement is observed between the measured thicknesses and the exact thickness of the samples. |
| Databáze: | OpenAIRE |
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