| Popis: |
Experiments revealed a dependence of sustained avalanche current on epitaxial layer structure, ambient temperature and chip size. With higher on-resistance, the avalanche current normally increases as well. A new mixed-mode simulation model proposed before explained the dependencies of avalanche current on device structure due to inherent instabilities. In this work, the simulation model was extended to explain found dependencies of avalanche current on chip size and therefore the chip layout and chosen external gate resistance. |
