In situ experiments of high resolution transmission electron microscopy: a review

Autor:	Meijie Yin, Dongfeng Diao, Nan Jian, Xi Zhang
Rok vydání:	2021
Předmět:	In situ Materials science business.industry Computer Science (miscellaneous) Optoelectronics High-resolution transmission electron microscopy business Engineering (miscellaneous)
Zdroj:	Journal of Shenzhen University Science and Engineering. 38:441-452
ISSN:	1000-2618
DOI:	10.3724/sp.j.1249.2021.05441
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::00ff3346c5ba4fbaeedbeaf82a74927d https://doi.org/10.3724/sp.j.1249.2021.05441 Zobrazit plný text záznamu