48947 Impact of X-ray tomographic microscopy on deformation studies of a SiC/Al MMC

Autor:	John H. Kinney, T.M. Breunig, M. C. Nichols, A. Guvenilir, S.R. Stock
Rok vydání:	1994
Předmět:	Materials science Nuclear magnetic resonance Tomographic reconstruction Mechanical Engineering Microscopy X-ray General Materials Science Deformation (meteorology) Condensed Matter Physics
Zdroj:	NDT & E International. 27:110
ISSN:	0963-8695
DOI:	10.1016/0963-8695(94)90404-9
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::00f3ea2bfcd72c3643b08272ebf97492 https://doi.org/10.1016/0963-8695(94)90404-9 Zobrazit plný text záznamu