Determination of elastic constants in thin films using hydrogen loading

Autor:	Hans-Ulrich Krebs, U. Geyer, Astrid Pundt, Reiner Kirchheim, Sebastian Fähler, M. Bicker, U. v. Hülsen, U. Laudahn
Rok vydání:	1999
Předmět:	Diffraction Materials science Physics and Astronomy (miscellaneous) Hydrogen Stress–strain curve chemistry.chemical_element Substrate (electronics) Curvature Stress (mechanics) Condensed Matter::Materials Science Crystallography chemistry X-ray crystallography Composite material Thin film
Zdroj:	Applied Physics Letters. 74:647-649
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.123028
Popis:	By measuring stress and strain that build up in thin films during hydrogen absorption, the elastic constants of the films can be determined, if a one-dimensional elastic behavior occurs only. This will be demonstrated for hydrogen absorption in Nb films. The in-plane stress is determined from the substrate curvature that is measured by using a two-beam laser setup. The out-of-plane strain is measured via x-ray diffraction. Furthermore, this method allows us to distinguish whether the film is plastically or elastically deformed by checking the reversibility of the stress–strain curve. In the case of a 250-nm-thick Nb film, the elastic constants obtained are similar to that of bulk Nb.
Databáze:	OpenAIRE
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