A set of test and measuring equipment in the field of electromagnetic compatibility

Autor:	V. E. Bobikov, A. A. Chumakov, G. D. Domashenko, V. P. Lisitsyn, M. G. Nikiforov, L. A. Busygina
Rok vydání:	2011
Předmět:	Electromagnetic field Engineering Field (physics) business.industry Acoustics Electrical engineering Electromagnetic compatibility Nanosecond Measuring equipment Set (abstract data type) Microsecond Instrumental support Electrical and Electronic Engineering business
Zdroj:	Russian Electrical Engineering. 82:464-468
ISSN:	1934-8010 1068-3712
DOI:	10.3103/s1068371211090045
Popis:	Instrumental support of scientific research and EMC tests are considered. Sample generators of field and conducted interferences of microsecond, nanosecond, and subnanosecond ranges are given. The structure of an optoelectronic electromagnetic field gage is described. Characteristics of TEM and GTEM chambers are given.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::007537448ab544e01daf9b322ebbceac https://doi.org/10.3103/s1068371211090045 Zobrazit plný text záznamu Full text from SpringerLink