Microscopy Techniques for Topography Image Acquisition of Marks on Cartridge Cases

Autor: Milan Navrátil, Vojtěch Křesálek, Adam Kouteckỳ, Zdenĕk Maláník
Jazyk: angličtina
Rok vydání: 2016
Předmět:
Zdroj: Sensors & Transducers, Vol 206, Iss 11, Pp 43-51 (2016)
ISSN: 1726-5479
2306-8515
Popis: Despite very high importance of tool mark analysis in criminalistics domain, the image acquisition and comparison of tool marks remains a difficult and time-consuming effort. This work deals with description of selected microscopy techniques applied to examination of marks on the surface of fired cartridge cases, specifically on marks after firing pin. They are represented by 3-D topography images (scanning probe microscopy and laser scanning confocal microscopy) and 2-D images (scanning electron microscopy and light microscopy in bright field).
Databáze: OpenAIRE