Hot spot detection in integrated circuits laterally accessing to the substrate

Autor:	Perpiñà, Xavier, Altet Sanahujes, Josep|||0000-0002-6939-6475, Jordà, Xavier, Vellvehi, Miquel
Přispěvatelé:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Jazyk:	angličtina
Rok vydání:	2010
Předmět:	Metal oxide semiconductors Complementary Electrònica Electrical engineering Enginyeria electrònica [Àrees temàtiques de la UPC] Electronic Metal oxide semiconductor field-effect transistors Integrated circuits Circuits integrats
Zdroj:	Recercat. Dipósit de la Recerca de Catalunya instname UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC)
Popis:	Thermal management of nano estructures requires the use of temperature monitoring strategies. In this work we expose a strategy bases on sensing the heat-flux within the chip substrate with a probe-laser beam. As the beam passes through the die, it experiences a deflection directly proportional to the heat-flux found along its trajectory (Internal Interfrared-laser deflection technique, IIR-LD) . As application example, we expose how hot spots can be detected in Integrated Circuits.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f7a4ffd0bf6455c72af5c85edf525fd9 https://hdl.handle.net/2117/10650 Zobrazit plný text záznamu