On-wafer time-domain measurement of pulse-to-pulse stability and multi-tones load-pull characterization of linearity to improve the nonlinear modeling of thermal/trapping effects in power GaN HEMTs for radar and telecom applications

Autor:	Barataud, Denis, Campovecchio, Michel, Martin, Audrey, Medrel, Pierre, Guillaume, Neveux, Prigent, Michel, Nallatamby, Jean-Christophe, Quéré, Raymond, Laurent, Sylvain, Teyssier, Jean-Pierre
Přispěvatelé:	Systèmes RF (XLIM-SRF), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Jazyk:	angličtina
Rok vydání:	2018
Předmět:	[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ComputingMilieux_MISCELLANEOUS [SPI.TRON]Engineering Sciences [physics]/Electronics
Zdroj:	EuMW 2018 EuMW 2018, Sep 2018, MAdrid, Spain
Popis:	International audience
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f0026191a950cd5be532349a87dafd5c https://hal-unilim.archives-ouvertes.fr/hal-02013184 Zobrazit plný text záznamu