Surface and Bulk Properties of Oxygenated FZ Silicon Wafers for Particle Detector Applications

Autor:	C L Claeys, P. Rai-Choudhury, Pierluigi Bellutti, Maurizio Boscardin, Dalla Betta, Gian Franco, Ferrario, Lorenza, Gregori, Paolo, Nicola Zorzi
Zdroj:	Fondazione Bruno Kessler-IRIS Maurizio Boscardin
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e2e2d10dc36b8371f3c480d7a82a8b20 https://cris.fbk.eu/handle/11582/57 Zobrazit plný text záznamu