Microscopic evidence of the role of the near field enhancement in the short pulse damage mechanism of diffraction gratings

Autor: Hocquet, Steve, Neauport, Jérôme, Bonod, Nicolas
Přispěvatelé: Centre d'études scientifiques et techniques d'Aquitaine (CESTA), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), CLARTE (CLARTE), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS), Neauport, Jerome
Jazyk: angličtina
Rok vydání: 2011
Předmět:
Zdroj: Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2011
Applied Physics Letters, 2011
ISSN: 0003-6951
Popis: International audience; We investigate the short pulse laser induced damage initiation mechanism on multilayer dielectric (MLD) pulse compression gratings. We report by means of scanning electron microscopy that damages initiate on the edge of the grating pillars opposite to the incoming wave. It demonstrates, at the scale of a grating line, the role of the electric field in the damage process but we also that grating pillars damage is also spatially modulated in the form of a periodic ripple pattern developing along the polarization direction.
Databáze: OpenAIRE