| Autor: |
Nowak, Stanislaw H., Bjeoumikhov, Aniouar, von Borany, Johannes, Buchriegler, Josef, Munnik, Frans, Petric, Marko, Renno, Axel D., Radtke, Martin, Reinholz, Uwe, Scharf, Oliver, Strüder, Lothar, Wedell, Reiner., Ziegenrücker, Rene |
| Jazyk: |
angličtina |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
X-Ray Spectrometry 44(2015), 135-140 |
| Popis: |
We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5μm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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