Monolayer resolution in medium-energy ion-scattering experiments on the NiSi2(111) surface
| Autor: | Vrijmoeth, J., Zagwijn, P.M., Frenken, J.W.M., Veen, J.F. van der |
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| Jazyk: | angličtina |
| Rok vydání: | 1991 |
| Zdroj: | Physical Review Letters, 67(9), 1134-1137. AMER PHYSICAL SOC Physical Review Letters, 67(9), 1134-1137 |
| ISSN: | 0031-9007 |
| Popis: | The surface structure of the epitaxial NiSi2/Si(111) system has been determined applying a new ion-scattering method. Detecting backscattered ions with ultrahigh energy resolution we resolve the signals from successive atomic layers. From both their intensity and energy, which depends on the specific ion trajectories, we directly deduce the (sub)surface atom coordinates. Applying this new approach, we find that the NiSi2(111) surface has a bulklike topology, i.e., it is terminated by a Si-Ni-Si triple layer. The outermost Ni-Si and Ni-Ni interlayer distances are relaxed from their bulk values. |
| Databáze: | OpenAIRE |
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