Outlier detection for single particle analysis in Electron Microscopy

Autor:	Sorzano, C. O. S., Vargas, J., La Rosa-Trevin, J. M., Zaldivar-Peraza, A., Joaquin Oton, Abrishami, V., Foche, I., Marabini, R., Caffarena, G., Carazo, J. M.
Zdroj:	ResearcherID Publons
Databáze:	OpenAIRE
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