Investigating the capability of microfocus x-ray computed tomography for areal surface analysis of additively manufactured parts
Autor: | Andrew Townsend, Liam Blunt, Paul Bills |
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Jazyk: | angličtina |
Rok vydání: | 2016 |
Předmět: | |
Zdroj: | American Society for Precision Engineering Summer Topical Meeting: Dimensional Accuracy and Surface Finish in Additive Manufacturing University of Huddersfield-PURE |
Popis: | INTRODUCTION The ability to perform non-destructive areal surface analysis, for example of the internal surfaces of additively manufactured (AM) parts has potential advantages during product development and for production process control. This paper reports on the extraction of areal surface information from microfocus x-ray computed tomography (XCT) data. Using this novel technique a range of areal parameter values were generated from a surface section extracted from XCT scan data of an as-built (no post-processing) AlSi10Mg additively manufactured part. This was then compared with the parameter values generated from a focus variation scan of the same surface section. The data comparison method involving normalisation of data format to allow analysis using industry-standard software, such as MountainsMap (Digital Surf, Besançon, France) or SurfStand (The Centre for Precision Technologies UoH) is demonstrated. Importing the extracted surfaces into these powerful software packages allows one-click data filtering per ISO 25178-3 [1] and the generation of a comprehensive suite of areal surface parameter values. These include feature and field parameters, amplitude, spatial, hybrid and functional parameters, as defined in ISO 25178-2 [2]. A method for characterising the capability of XCT for areal surface measurement is demonstrated by comparing results obtained from samples taken from a Rubert comparator test panel, with sample surface Ra values between 0.8 μm and 50 μm. |
Databáze: | OpenAIRE |
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