VES1 - ATE and Test Quality
| Autor: | Eggersgluess, Stephan |
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| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) |
| Popis: | Improving Test Quality and Reliability via In-system/In-field Testing Lee HARRISON (Siemens EDA – United Kingdom) How ACS enables an Open Innovation Ecosystem for AI/ML applications in the Semiconductor Value Chain Matthias SAUER, Sonny BANWARI (ADVANTEST – Germany) The Need for New DFT Approaches to Scan Thomas KOEHLER (TERADYNE, Germany) |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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