Analysis of motion of dislocations with thresholds by experiments in high-voltage electron microscope

Autor:	Vjacheslav Ermishkin, Kutilin, V. G., Myshlyaev, M. M., Novikov, I. I.
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::93498ca6579b0301677a48111c3c180d http://www.scopus.com/inward/record.url?eid=2-s2.0-0026834823&partnerID=MN8TOARS Zobrazit plný text záznamu