Integration of the Scan-test Method into an Architecture Specific Core-test Approach

Autor:	Feige, C., ten Pierick, J., Wouters, C., Tangelder, R.J.W.T., Kerkhoff, Hans G.
Rok vydání:	1998
Předmět:	METIS-112983 METIS-111661
Zdroj:	Proceedings of the IEEE European Test Workshop (ETW), 241-245 STARTPAGE=241;ENDPAGE=245;TITLE=Proceedings of the IEEE European Test Workshop (ETW) Journal of electronic testing, 1999(1/2), 125-132. Springer
ISSN:	0923-8174
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8fa908a7f94f32adada6d621bc55ad3f https://research.utwente.nl/en/publications/integration-of-the-scantest-method-into-an-architecture-specific-coretest-approach(76ab705f-3cd4-4a27-8c73-10d20892a291).html Zobrazit plný text záznamu Full text from SpringerLink