| Autor: |
Krishnan, S., Kerkhoff, H.G. |
| Přispěvatelé: |
TNO Kwaliteit van Leven |
| Jazyk: |
angličtina |
| Rok vydání: |
2010 |
| Předmět: |
|
| Zdroj: |
2010 15th IEEE European Test Symposium, ETS'10, 24 May 2010 through 28 May 2010, Prague. Conference code: 82013, 250 |
| Popis: |
A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit. © 2010 IEEE. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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