Optimal points of measurement for the identification of sources by harmonic expansion
| Autor: | Tavernier, François, LI, Zhao, Bréard, Arnaud, Sartori, Carlos, Krähenbühl, Laurent |
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| Přispěvatelé: | Ampère, Département Méthodes pour l'Ingénierie des Systèmes (MIS), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), LIA franco brésilien James Clerk Maxwell (CNRS-CNPq) (LIA817), Escola Politecnica da Universidade de Sao Paulo [Sao Paulo], Instituto de Pesquisas Energéticas e Nucleares [São Paulo] (IPEN/CNEN-SP), Universidade de São Paulo (USP)-Comissão National de Energia Nuclear (CNEN), ANR-14-CE22-0009,PolHar-CEM,Développement Multipolaire en Harmoniques appliqué à la modélisation de source complexe en CEM(2014) |
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: | |
| Zdroj: | Proceedings of the IEEE Global Electromagnetic Compatibility Conference GEMCCON GEMCCON, Nov 2017, São Paulo, Brazil |
| Popis: | International audience; A predictive EMC method for inductive coupling, using measurements carried out on a sphere encompassing a tested device, is at the moment under development in our laboratory. This method makes it possible to construct an equivalent source in the form of a sum of multipole terms. Once the equivalent sources of two devices have been designed, their inductive coupling can be calculated to prevent future EMC problems. Therefore, we have developed a measurement bench which allows the sensor to describe a spherical surface around the device we want to characterize. In this article, we present two methods for choosing the position of the measurement points (depending on the number of measurements and the chosen sensor) by minimizing the reconstruction error. The first one determines the position of the measurement points in order for them to be equidistant. In the second one, the source is considered to be random, and we maximize the determinant of the covariance matrix as a function of the sensor positions. This method allows us to define the best measurement points for a chosen number of points. This method is iterative and the number of measurements to be carried out is constrained by the maximum degree of spherical harmonics expansion. A comparison of the performances, advantages and disadvantages of these two methods is proposed and illustrated by an example |
| Databáze: | OpenAIRE |
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