Dual Harmonic Kelvin Probe Force Microscopy for Surface Potential Measurements of Ferroelectrics

Autor:	Collins, L., Kilpatrick, J. I., Madhu Bhaskaran, Sriram, S., Weber, S. A. L., Jarvis, S. P., Rodriguez, B. J., Ieee
Zdroj:	ResearcherID
Databáze:	OpenAIRE
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