| Autor: |
Bérujon, Sébastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric |
| Přispěvatelé: |
European Synchrotron Radiation Facility (ESRF), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Institute of Cell Biology, University of Bern |
| Jazyk: |
angličtina |
| Rok vydání: |
2019 |
| Předmět: |
|
| Popis: |
17 pages, 12 figures; X-ray near-field speckle-based phase-sensing approaches provide an efficient means to characterize optical elements. Here, we present a theoretical review of several of these speckle methods and show some experimental applications for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport x-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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